Imaging device and electronic apparatus

ABSTRACT

The present technology relates to an imaging device that can reduce the size thereof, and to an electronic apparatus. 
     An upper substrate and a lower substrate are stacked. A pixel and a comparing unit that compares the voltage of a signal from the pixel with the ramp voltage are provided on the upper substrate, the ramp voltage varying with time. A storage unit that stores a code value obtained at a time when a comparison result from the comparing unit is inverted is provided on the lower substrate. The comparing unit is formed with a transistor that receives the voltage of the signal from the pixel at the gate, receives the ramp voltage at the source, and outputs a drain voltage. Accordingly, the imaging device can be made smaller in size. The present technology can be applied to image sensors.

TECHNICAL FIELD

The present technology relates to imaging devices and electronicapparatuses. More party, the present technology relates to an imagingdevice suitable for a size reduction, and an electronic apparatus.

BACKGROUND ART

Recent imaging devices are expected to become smaller in size, whilebeing expected to have a larger number of pixels, higher image quality,and a higher processing speed. As an imaging device that satisfies suchdemands, a layered imaging device has been suggested (see PatentDocument 1, for example).

In a layered imaging device, a chip having a signal processing circuitformed thereon, instead of a supporting substrate for an imaging device,is used, and the pixel portion is overlapped on the chip. It issuggested that an imaging device can be made smaller in size with such astructure.

CITATION LIST Patent Document

-   Patent Document. 1: Japanese Patent Application Laid-Open No.    2009-17720

SUMMARY OF THE INVENTION Problems to be Solved by the Invention

In a layered imaging device, if the pixels are made smaller, thecircuits mounted on the chip below the pixels need to be also madesmaller. The circuits mounted on the chip may be AD converter circuits,for example. The AD converter circuits involve a large number oftransistors, and are not easily made smaller in size. Therefore, it issuggested that one AD converter circuit should be shared by more thanone pixel.

However, in a case where one AD converter circuit is shared by more thanone pixel, control is performed so that signals from the pixel s areread out while being switched. Therefore, if one AD converter circuithandles a large number of pixels, the time lags among the pixels to beread become larger. As a result, when a moving object is imaged, theimaged object might be distorted, or it might take a long time to readone image.

For the above reasons, the AD converter circuits mounted on the chipbelow the pixels are expected to be smaller in size as the pixels becomesmaller in size. Also, the number of pixels to be handled by one ADconverter circuit is expected to become smaller.

The present technology has been developed in view of the abovecircumstances, and aims to provide a layered imaging device and furtherreduce the size of the imaging device.

Solutions to Problems

An imaging device of one aspect of the present technology includes anupper substrate and a lower substrate that are stacked. A pixel and acomparing unit that compares the voltage of a signal from the pixel withthe ramp voltage of a ramp signal are provided on the upper substrate,the ramp voltage varying with time A storage unit that stores a codevalue obtained at a time when a comparison result from the comparingunit is inverted is provided on the lower substrate.

The comparing unit may be formed with a transistor that receives thevoltage of the signal from the pixel at the gate, receives the rampvoltage at the source, and outputs a drain voltage.

A voltage for resetting the transistor may be higher than thepower-supply voltage of a circuit of a later stage.

The power-supply voltage of the storage unit may be lower than thepower-supply voltage of the circuit of the later stage.

The power-supply voltage of the upper substrate may be higher than thepower-supply voltage of the lower substrate.

An analog circuit may be provided on the upper substrate, and a digitalcircuit may be provided on the lower substrate.

The comparing unit and the storage unit may be formed with Negativechannel Metal Oxide Semiconductors (NMOSs), and the comparing unit andthe storage unit may have the same high power supply while havingdifferent low power supplies.

The comparing unit and the storage unit may be formed with Positivechannel Metal Oxide Semiconductors (PMOSs), and the comparing unit andthe storage unit may have the same low power supply while havingdifferent high power supplies.

Of the transistors included in the storage unit, a transistor thatreceives a signal from the comparing unit is made to have a highwithstand voltage.

An electronic apparatus of one aspect of the present technologyincludes: an imaging device including an upper substrate and a lowersubstrate that are stacked, wherein a pixel and a comparing unit thatcompares the voltage of a signal from the pixel with the ramp voltage ofa ramp signal varying with time are provided on the upper substrate, anda storage unit that stores a code value obtained at a time when acomparison result from the comparing unit is inverted is provided on thelower substrate; and a signal processing unit that performs signalprocessing on a signal that is output from the imaging device.

In an imaging device of one aspect of the present technology, an uppersubstrate and a lower substrate are stacked. A pixel and a comparingunit that compares the voltage of a signal from the pixel with the rampvoltage of a ramp signal are provided on the upper substrate, the rampvoltage varying with time. A storage unit that stores a code valueobtained at a time when a comparison result from the comparing unit isinverted is provided on the lower substrate.

An electronic apparatus of one aspect of the present technology includesthe above imaging device.

Effects of the Invention

According to one aspect of the present technology, a layered imagingdevice can be formed. Also, the size of the imaging device can befurther reduced.

It should be noted that effects of the present technology are notlimited to the effect described above, and may include any of theeffects described in the present disclosure.

BRIEF DESCRIPTION OF DRAWINGS

FIG. 1 is a diagram for explaining the structure of an imaging element.

FIG. 2 is a diagram for explaining the circuits provided on an uppersubstrate and a lower substrate.

FIG. 3 is a diagram showing the circuit configuration of an imagingelement.

FIG. 4 is a diagram for explaining the circuits provided on an uppersubstrate and a lower substrate.

FIG. 5 is a diagram showing the circuit configuration of an imagingelement.

FIG. 6 is a diagram for explaining a time when a comparing transistor isinverted.

FIG. 7 is a diagram for explaining a time when the comparing transistoris inverted.

FIG. 8 is a diagram showing the circuit configuration of an imagingelement.

FIG. 9 is a diagram for explaining a read operation.

FIG. 10 is a diagram for explaining a read operation.

FIG. 11 is a diagram showing the circuit configuration of an imagingelement.

FIG. 12 is a diagram showing the circuit configuration of an imagingelement.

FIG. 13 is a diagram for explaining a read operation.

FIG. 14 is a diagram for explaining a read operation.

FIG. 15 is a diagram for explaining a combination of higher bits andlower bits.

FIG. 16 is a diagram for explaining a combination of higher bits andlower bits.

FIG. 17 is a diagram for explaining a combination of higher bits andlower bits.

FIG. 18 is a diagram for explaining a read operation.

FIG. 19 is a diagram for explaining a read operation.

FIG. 20 is a diagram showing the structure of an electronic apparatus.

MODES FOR CARRYING OUT THE INVENTION

The following is a description of modes (hereinafter referred to asembodiments) for carrying out the present technology. Explanation willbe made in the following order.

-   -   1. Structure of a layered imaging device    -   2. Embodiment of arrangement of circuits on respective layers    -   3. Another embodiments of arrangement of circuits on respective        layers    -   4. Structure with a reduced number of latches    -   5. Electronic apparatus    -   6. Recording medium

<Structure of a Layered Imaging Device>

FIG. 1 is a diagram showing the structure of an imaging device to whichthe present technology is applied. The present technology can be appliedto a layered imaging device. In a layered imaging device, a chip havinga signal processing circuit formed thereon, instead of a substratesupporting the portion of pixels, is used, and the pixel portion isoverlapped on the chip. With this structure, the imaging device can bemade smaller in size.

As shown in FIG. 1, on an upper substrate 10, pixels 21 are arranged ina matrix fashion, and a pixel drive circuit 22 for driving therespective pixels 21 is provided. On a lower substrate 11, A/DConverters (ADCs) 31 are arranged in a matrix fashion in the positioncorresponding to the pixels 21. In the example illustrated in FIG. 1,one block is formed with four (2×2) pixels, and one ADC 31 processes thefour pixels 21 of one block. In such a structure, the ADCs 31 are madeto operate in parallel, and each of the ADCs 31 performs AD conversionwhile scanning four pixels.

An output circuit 32, a sense amplifier 33, a V scan circuit 34, atiming generator circuit 35, and a D/A Converter (DAC) are also mountedon the lower substrate 11. Outputs from the ADCs 31 are output to theoutside via the sense amplifier 33 and the output circuit 32. Theprocessing related to reading from the pixels 21 is performed by thepixel drive circuit 22 and the V scan circuit 34, and is controlled bythe timing generated by the timing generator circuit 35. The DAC 36 isalso a circuit that generates a ramp signal.

A ramp signal is a signal to be supplied to the comparators of the ADCs31. Referring now to FIG. 2, the inner structure of each ADC 31 isdescribed. FIG. 2 is a block diagram showing the structures of thepixels 21 of one block and an ADC 31. A signal from the pixels 21 of oneblock formed with four (2×2) pixels is compared with the ramp voltage ofthe ramp signal by the comparator 51 of the ADC 31.

The ramp voltage is a voltage that becomes gradually lower from apredetermined voltage. When the ramp voltage starts dropping, and asignal from the pixels 21 crosses the ramp voltage when the voltage ofthe signal from the pixels 21 becomes equal to the ramp voltage), theoutput of the comparator 51 is inverted. The output of the comparator 51is input to a latch circuit 52. A code value indicating the time at thatmoment is input to the latch circuit 52, and the code value generated byinverting the output of the comparator 51 is saved and is later readout.

FIG. 3 is a circuit diagram of the imaging device including the ADCs 31.FIG. 3 shows the respective circuits included in the upper substrate 10and the lower substrate 11 shown in FIG. 1. The upper substrate 10includes the pixels 21, and the circuit thereof has the structure shownon the left side of FIG. 3. Here, a structure in which four pixels shareone floating diffusion (FD) is described as an example.

Photodiodes (PD) 101-1 through 101-4 as photoelectric conversion unitsare connected to transfer transistors (Trf) 102-1 through 102-4,respectively. Hereinafter, when there is no need to distinguish thephotodiodes 101-1 through 101-4 from one another, the photodiodes 101-1through 101-4 will be referred to simply as the photodiodes 101. Othercomponents will be referred to in the same manner.

Each of the transfer transistors 102-1 through 102-4 is connected to afloating diffusion (ED) 103. The transfer transistors 102 transferaccumulated signal charge that has been photoelectrically converted bythe photodiodes 101 to the floating diffusion 103 when a transfer pulseis provided.

The floating diffusion 103 functions as the charge-voltage conversionunit that converts the signal charge to a voltage signal. A resettransistor (Rst) 104 has its drain electrode connected to a pixel powersupply of a power-supply voltage Vdd, and has its source electrodeconnected to the floating diffusion 103. Prior to the transfer of thesignal charge from the photodiodes 101 to the floating diffusion 103,the reset transistor 104 supplies a reset pulse RST to the gateelectrode, and resets the voltage of the floating diffusion 103 to areset voltage.

An amplifying transistor (Amp) 105 has its gate electrode connected tothe floating diffusion 103, and has its drain electrode connected to apixel power supply of the power-supply voltage Vdd. The voltage of thefloating diffusion 103 after being reset by the reset transistor 104 isoutput as the reset level, and the voltage of the floating diffusion 103after the signal charge is transferred by the transfer transistors 102is further output as the signal level.

The combination of the amplifying transistor 105 and a load MOS 121provided on the lower substrate 11 functions as a source follower, andtransfers an analog signal indicating the voltage of the floatingdiffusion 103 to the comparator 51 of the lower substrate 11.

The comparator 51 can be formed with a differential amplifier circuit.The comparator 51 includes a differential transistor pair unit includingtransistors 141 and 144, a load transistor pair unit that includestransistors 142 and 143 serving as output loads for the differentialtransistor pair unit and are located on the power supply side, and acurrent source unit 145 that supplies a constant operating current andis located on the ground (GND) side.

The respective sources of the transistors 141 and 144 are connected tothe drain of the transistor of the current source unit 145, and thedrains of the corresponding transistors 142 and 143 of the loadtransistor pair unit are connected to the respective drains (outputterminals) of the transistors 141 and 144.

The output of the differential transistor pair unit (or the drain of thetransistor 144 in the example illustrated in the drawing) issufficiently amplified and is then output to the latch circuit 52 via abuffer 146.

A pixel signal transferred from the pixels 21 is supplied to the gate(input terminal) of the transistor 141, and a ramp signal is suppliedfrom the DAC 36 to the gate (input terminal) of the transistor 144.

The latch circuit 52 is formed with ten latch columns 161-1 through.161-10. Codes D0 through D9 (hereinafter referred to as the code valuesD) are input to the latch columns 161-1 through 161-10, respectively.The code values D0 through D9 are code values indicating the time atthat moment.

Each latch column 161 is a dynamic circuit, so as to reduce size. Theoutput from the comparator 51 is input, to the gates of transistors 171that switch on and off the respective latch columns 161. The code valuegenerated by inverting the output of the comparator 51 is saved in thislatch circuit 52, is then read out, and is output to the sense amplifier33 (FIG. 1).

In this structure, the pixels 21 are provided on the upper substrate 10,and the circuit is provided on the lower substrate 11. The uppersubstrate 10 and the lower substrate 11 can be joined by a Cu—Cu bond,for example. For this Cu—Cu bond, a technique disclosed in JapanesePatent Application Laid-Open No. 2011-54637, filed by this applicant,can be used.

As the upper substrate 10 and the lower substrate 11 are to be stackedon each other, the upper substrate 10 and the lower substrate 11preferably have almost the same size in principle. In other words, ifone of the substrates is larger than the other, the size of the largersubstrate becomes the upper limit size of the imaging device formed withthe upper substrate 10 and the lower substrate 11.

The pixels 21 provided on the upper substrate 10 involve fewertransistors, and are easily made smaller in size. Of the lower substrate11, the ADC 31, for example, involves a large number of transistors, andare not easily made smaller in size. If the same number of ADCs 31 asthe number of the pixels 21 placed on the upper substrate 10 are placedon the lower substrate 11, there is a high possibility that the lowersubstrate 11 will become larger than the upper substrate 10. In view ofthis, one ADC 31 is shared by more than one pixel 21. In the exampleillustrated in FIG. 1, four pixels share one ADC 31.

In a case where one ADC 31 is shared by more than one pixel, control isperformed so that signals from the pixels 21 (four pixels in this case)are read out while being switched. Therefore, if one ADC 31 handles alarge number of pixels, the time lags among the pixels to be read becomelarger. Therefore, when a moving object is imaged, for example, theimaged object might be distorted, or it might take a long time to readone image.

For the above reasons, the ADCs 31 on the chip (the lower substrate 11in this case) to be stacked on the pixels 21 are expected to be smallerin size as the pixels 21 become smaller in size. Also, the number ofpixels to be handled by one ADC 31 is expected to become smaller whenthe chip is made smaller in size.

As shown in FIG. 3, the comparator 51 and the load MOS 121 are analogcircuits, and might vary in performance. Therefore, in the background,it is difficult to make the transistors smaller or lower the voltagethereof. As the latch circuit 52 is a digital circuit, it is relativelyeasy to make the latch circuit 52 smaller in size or lower the voltagethereof.

As a large number of such small-sized digital circuits and analogcircuits are arranged in the close vicinity of one another, it becomesdifficult to optimize the power-supply voltage and the withstand voltageof the transistors. Also, the pixels 21 and the comparators 51 require asteady-state current, and therefore, it is not easy to reduce powerconsumption. Also, the pixels 21 generate outputs while allowing currentto pass therethrough, and therefore, thermal noise is generated.

As described above, where the pixels 21 are simply placed on the uppersubstrate 10, and circuits are simply placed on the lower substrate 11,the above problems might occur.

<Embodiment of Arrangement of Circuits on the Respective Layers>

In view of the above, the structure shown in FIG. 4 is formed. Thestructure shown in FIG. 1 is equivalent to the structure shown in FIG.2, and FIG. 4 is a block diagram showing a structure formed with thepixels 21 of one block and an ADC 31. In the structure shown in FIG. 4,the comparator and the latch circuit constituting the ADC 31 areseparated and are placed on the upper substrate 10 and the lowersubstrate 11.

To be distinguished from the comparator shown in FIG. 2, the comparatorplaced on the upper substrate 10 is denoted by a different referencenumeral, and will be hereinafter referred to as the comparator 201. Aswill be described later, the latch circuit 52 can have the samestructure as the latch circuit 52 described above with reference toFIGS. 2 and 3, and therefore, the latch circuit 52 will be describedbelow without a change in reference numeral.

As shown in FIG. 4, the pixels 21 and the comparator 201 are placed onthe upper substrate 10, and a signal from the pixels 21 is compared witha ramp signal. A comparison result from the comparator 201 is suppliedto the latch circuit 52 placed on the lower substrate 11. A code (Code)indicating time information is supplied to the latch circuit 52. Thelatch circuit 52 converts the signal from the pixels 21 into a digitalsignal, and outputs the digital signal to a later stage.

All the components constituting the comparator 201 may be placed on theupper substrate 10, or the main components of the comparator 201 may beplaced on the substrate 10. The other components of the ADC 31 than thecomponents placed on the upper substrate 10 are placed on the lowersubstrate 11.

As described above, the pixels 21 and the comparator 201 are placed onthe upper substrate 10, and the latch circuit 52 is placed on the lowersubstrate 11. As described above, in the imaging device shown in FIG. 4,the pixels 21 and the ADC 31 are not placed on the upper substrate 10and the lower substrate 11 in the same manner as the pixels 21 and theADC 31 separated in the structure shown in FIG. 2. Instead, the ADC 31is divided, and the divided portions are placed on the upper substrate10 and the lower substrate 11.

FIG. 5 shows an example circuit configuration of an imaging devicecorresponding to FIG. 4. In the example circuit configuration shown inFIG. 5, the same components as those in the example circuitconfiguration shown in FIG. 3 are denoted by the same reference numeralsas those used in FIG. 3, and explanation of them will not be repeatedbelow. As described above, the structures of the pixels 21 and the latchcircuit 52 are the same as those in the circuit configuration shown inFIG. 3, and the circuit portion equivalent to the comparator 201 differsfrom that shown in FIG. 3.

In the circuit configuration shown in FIG. 3, the voltage signal of thefloating diffusion 103 is supplied to the amplifying transistor 105. Inthe circuit configuration shown in FIG. 5, however, the voltage signalof the floating diffusion 103 is applied to a comparing transistor (Cmp)221.

That is, in the circuit configuration shown in FIG. 5, the floatingdiffusion 103 is connected to the gate of the comparing transistor (Cmp)221. The comparing transistor 221 performs not a source followeroperation but a voltage value comparing operation. One of the mainelectrodes of the comparing transistor 221 is connected not to thepower-supply voltage but to the ramp (Ramp) signal line, and the otherone of the main electrodes is connected to the gate of a buffer 224through a signal line (SE).

An SL 222 has a parasitic capacitance and a capacitative elementdepending on the structure. An Sr 223 will be described as a transistorthat resets the SL 222 to a predetermined voltage, such as 3 V. Theoutput from the buffer 224 is supplied to the latch circuit 52 of thelower substrate 11 joined thereto by a Cu—Cu bond, for example.

On the side of the lower substrate 11, the latch circuit 52 includinglatch columns 161-1 through 161-10 is provided. The output from thebuffer 224 is input to the gates of transistors 181 that switch on andoff the latch circuit 52. The structure of the latch circuit 202 is thesame as the latch circuit 52 shown in FIG. 3, and performs the sameprocessing as the latch circuit 52. However, the latch circuit 202differs from the latch circuit 52 in that the transistors 181 are formedwith Positive channel Metal Oxide Semiconductors (PMOSs).

As described, above, in the circuit configuration shown in FIG. 5, thestructure of the comparator 51 is simpler than that in the circuitconfiguration shown in FIG. 3. Also, the load MOS 121 is not included.The comparator 51 and the load MOS 121 shown in FIG. 3 are analogcircuits, and might vary in performance. Therefore, it is difficult tomake the transistors smaller or lower the voltage thereof in thebackground.

On the other hand, the comparator 51 shown in FIG. 5 does not use adifferential amplifier circuit, but is formed with the comparingtransistor 221. Accordingly, the structure of the comparator 51 issimplified. Also, in the circuit configuration shown in FIG. 5, the loadMOS 121 is eliminated. In this configuration, the number of transistorscan be reduced, and the structure of the comparator 201 can be madesmaller in size.

A mechanism for digitizing the voltage of the floating diffusion. 103 inthe circuit configuration shown in FIG. 5 is now described.

First, a pulse is input to the Sr 223, and the SL 222 is reset to 3 V.With this serving as a trigger, the buffer 224 outputs the low level (0V). Since the output from the buffer 224 is low, the PMOSs (thetransistors 181) of the latch columns 161 are switched on, and the codevalues D0 through D9 indicating time are supplied to the capacitativeelements of the latch columns 161.

FIG. 6 shows the variations in the ramp voltage and the SL signal of theSL 222 when the ramp voltage gradually drops from 2 V. When the rampvoltage (the solid line denoted by “Ramp” in the drawing) crosses thechannel voltage from the comparing transistor 221 (the dashed linedenoted by “Amp CHANNEL VOLTAGE” in the drawing) (time T1), thecomparing transistor 221 becomes conductive.

As the comparing transistor 221 becomes conductive, the voltage of theSL 222 (the solid line denoted by “SL” in the drawing) rapidly drops tothe voltage equal to the ramp voltage. As a result, the PMOS on/offboundary of the buffer 224 is crossed, and the buffer 224 is inverted tothe High level.

The PMOSs (the transistors 181) of the latch columns 161 are thenswitched off, and the latch capacitances are cut off from the codesignal, and the values at that point (the respective values of the codesD0 through D9) are saved. Through such a process, the voltage of thefloating diffusion 103 is digitized.

Referring now to FIG. 7, variations in the ramp voltage and the SLsignal of the SL 222 are again described. The upper portion of FIG. 7 isa diagram showing the comparing transistor 221 (Cmp 221), and the lowerportion of FIG. 7 is a diagram showing potentials. At time T0, the ramp(Ramp) voltage is 2 V, and the voltage of the SL 222 is 3 V. Thedownward direction in FIG. 7 is the positive direction. The Amp channelvoltage is denoted by “VFD” in FIG. 7.

The ramp voltage starts becoming gradually lower at time T0. Time T0′ isa time when time T0<time T0′<time T1 is satisfied. At time T0′, the rampvoltage is still higher than the channel voltage (VFD) from thecomparing transistor 221 (or is low in potential in the state shown inFIG. 7), and therefore, the voltage of the SL 222 remains 3 V.

At time T1, the ramp voltage and the Amp channel voltage (VFD) becomethe same (or have the same potential). After time T1, the potential ofthe ramp voltage is higher than the potential of the Amp channel voltage(VFD), and therefore, electrons rapidly flow toward the side of the SL222. After that, as shown as time T2, the potential of the ramp voltageand the potential of the SL 222 become higher by the same amount. Inother words, the voltage of the SL 222 drops in the same manner as theramp voltage.

As the potentials change in the above manner, the voltage relationshipis as shown in FIG. 6. The comparing transistor 221 can detect the timewhen the ramp voltage and the Amp channel voltage become substantiallythe same. When the ramp voltage and the Amp channel voltage becomesubstantially the same, the comparing transistor 221 becomes conductiveas described above, the PMOS on/off boundary of the buffer 224 iscrossed, and the buffer 224 is inverted to the high level.

Such an operation is performed simultaneously in all the ADCs 31. Afterthat, the latched signals are sequentially read into the sense amplifier33 row by row. The signals are then output from the sense amplifier 33via the output circuit 32.

With the structures shown in FIGS. 4 and 5, and through the operationdescribed above with reference to FIG. 6, the size of the comparator 201is greatly reduced. At the same time as being made smaller in size, thecomparator 201 is placed on the upper substrate 10.

As the upper substrate 10 and the lower substrate 11 are connected bythe output of the buffer 224, the upper substrate 10 can be a 3 Vsystem, and the lower substrate 11 can be a 1.5 V system. As the uppersubstrate 10 and the lower substrate 11 are driven with differentvoltages from each other as described above, the power supplies to theupper substrate 10 and the lower substrate 11 can be separated from eachother. Also, the manufacturing processes for the upper substrate 10 andthe lower substrate 11 can be optimized separately from each other.

Furthermore, the upper substrate 10 can be designed to accommodateanalog circuits, and the lower substrate 11 can be designed toaccommodate digital circuits. Accordingly, small analog circuits andsmall digital circuits can be prevented from coexisting in the vicinityof one another. As a result, the analog-digital boundary region can beeliminated, and the structure can be made smaller in size. Also, as anyunnecessary situation where different power supplies are provided in aconfusing manner can be avoided, the structure can be made smaller insize.

Although specific voltages such as 1.5 V, 2.5 V, and 3 V are shown inFIG. 5, those voltages are mere examples, and do not limit the presenttechnology. In the description below, specific voltages will also bementioned as examples, but will not limit the present technology in anyway.

Meanwhile, the power supply on the drain side of the Sr 223 ispreferably higher than the power supply for the buffer 224. In FIG. 5,the power supply for the Sr 223 is 3 V, and the power supply for thebuffer 224 is 2.5 V, for example. The reason for that is as follows. TheSL 222 is floating, and therefore, the voltage thereof varies with time.However, as the voltage of the SL 222 is set higher than the powersupply for the buffer 224, the margin of the off-state of the PMOSs canbe obtained.

The gate voltage of the Sr 223 may be boosted, or the Sr 223 may beformed with a transistor of a depression type, so as to form a structurethat passes 3 V. Although not shown in the drawings, the Sr 223 may beformed with a PMOS transistor, so as to increase the threshold value orboost the gate voltage in the off-state.

By another method of obtaining a margin of the off-state of the PMOSs, acapacitative element may be provided to the SL 222, so that variation inthe voltage of the SL 222 can be restrained by dark current.

The power supply for the reset drains of the pixels 21, the resetthreshold value, and the threshold value of the comparing transistor 221are preferably designed so as to satisfy the conditions described below.

The voltage of the floating diffusion 103 after reset is set at such avoltage that the charges to be transferred from the photodiodes 101 canbe received. Also, the voltage of the floating diffusion 103 after reset(or the gate voltage of the comparing transistor 221) is set at such avoltage that the comparing transistor 221 can be switched off when theramp voltage is the initial voltage of 2 V.

The power supply for the latch circuit 52 is preferably lower than thebuffer 224. This is because the latch capacitances can be certainly cutoff from the code (Code) signals when the PMOS transistor is switchedoff. In a case where the areas of the photodiodes 101 of the pixels 21are to be maximized, the upper substrate 10 and the lower substrate 11may be connected by the SL 222, and the buffer 224 and the Sr 223 may beplaced on the lower substrate 11.

<Another Embodiments of Arrangement of Circuits on Respective Layers>

FIG. 8 shows an example circuit configuration of another embodiment ofarrangement of circuits on the respective layers for further reducingthe size of an imaging device. The same components as those shown inFIG. 5 are denoted by the same reference numerals as those used in FIG.5, and explanation thereof will not be repeated below. In the circuitconfiguration shown in FIG. 8, all circuits are formed with NMOSs(Negative channel Metal Oxide Semiconductors), and the operating pointsare adjusted accordingly.

In the circuit configuration shown in FIG. 8, the upper substrate 10basically has a low power supply of 0 V and a high power supply of 3 V,and the lower substrate 11 basically has a low power supply of 1.5 V anda high power supply of 3 V. That s the high power supply sides of theupper substrate 10 and the lower substrate 11 have a common voltage.

In the lower substrate 11, the only portion corresponding to the pixels21 is the latch circuit 52. The circuits placed on the upper substrate10 and the latch circuit 52 placed on the lower substrate 11 are allformed with NMOSs. As all the circuits are formed with NMOSs, the buffer224 required in the circuit configuration shown in FIG. 5 can beeliminated. The Sr 223 is placed on the upper substrate 10 in theexample shown in FIG. 8.

The operation to be performed in the circuit configuration shown in FIG.8 is basically the same as the operation to be performed in the circuitconfiguration shown in FIG. 5. First, a pulse is input to the Sr 223,and the SL 222 is reset to 3 V. In this state, the transistors 181 ofthe latch columns 161 are switched on, and the code values D0 through D0indicating time are supplied to the capacitative elements of the latchcolumns 161.

The ramp voltage is then lowered gradually from 1.5 V. This case differsfrom the circuit configuration shown in FIG. 5 in that the ramp voltagestarts from 1.5 V, instead of 2 V. When the ramp voltage crosses thechannel voltage of the comparing transistor 221, the comparingtransistor 221 becomes conductive. The voltage of the SL 222 is rapidlylowered so as to be equal to the ramp voltage. The latch columns 161 areswitched off, the latch capacitances are cut off from the code signals,and the values at that point are saved.

Only the gates of the transistors 171 connected to the pixels of thelatch columns 161 become lower than 1.5 V (the low power supply for thelower substrate 11). Accordingly, the latch columns 161 can be certainlyswitched off, and the signals can be saved. Therefore, the insulatingfilms of the respective gates of the transistors 171-1 through 171-10included in the latch columns 161 are preferably thick and have a highwithstand voltage.

With the circuit configuration shown in FIG. 8, the voltage margin isnarrower than that with the circuit configuration shown in FIG. 5, butthe size of an imaging device can be further reduced.

The amplifying transistor 105 in the circuit configuration shown in FIG.3 outputs a signal while al lowing current to pass therethrough.Therefore, power consumption becomes larger. In the circuitconfiguration shown in FIG. 5 or 8, however, no steady-state current isrequired in obtaining an output from the comparing transistor 221.Accordingly, smaller power consumption can be realized.

Since the amplifying transistor 105 outputs a signal while allowingcurrent to pass therethrough, there is a high possibility that thermalnoise is generated. In the circuit configuration shown in FIG. 5 or 8,however, the comparing transistor 221 does not allow current to passtherethrough, no thermal noise is generated. Accordingly, influence ofthermal noise can be reduced.

The Signal Line (SL) 222 is floating, and therefore, a change in voltageis caused by dark current at defective pixels. In view of this, the SL222 may be drawn to the power-supply side with a very small current, soas not to be floating.

Referring now to FIGS. 9 and 10, processes related to reading areadditionally described. In FIGS. 9 and 10, one ADC 31 is provided to onepixel, for ease of explanation.

As the present technology is applied, the ADCs 31 can be made smaller insize. Even where one ADC 31 is provided for one pixel, both of the uppersubstrate 10 and the lower substrate 11 can be made smaller in size.Accordingly, it is possible to form a structure in which one ADC 31 isprovided for one pixel. In view of this, in the description below, oneADC 31 is provided for one pixel.

As described above with reference to FIG. 5 or 8, each ADC 31 is dividedand is placed on the upper substrate 10 and the lower substrate 11. Inthe examples shown in FIGS. 9 and 10, portions placed on the uppersubstrate 10 and the lower substrate 11 are collectively referred to asADCs 31.

The thick arrows in FIGS. 9 and 10 indicate the flows of signals. Thediagram shown on the left side in FIG. 9 shows a case where ADconversion involves 10 bits, and ten latch columns 161 are provided. Thediagram shown on the right side indicates the order of reading in such acase.

In a pixel 21, a reset operation is performed by a reset transistor 104,and a transfer operation is performed by a transfer transistor 102. Inthe reset operation, the voltage of a floating diffusion 103 when beingreset by the reset transistor 104 is output as a reset component(P-phase) from the pixel 21 to a vertical signal line (not shown).

In the transfer operation, the voltage of the floating diffusion 103 atthe time when the charge accumulated in the photodiode 101 istransferred by the transfer transistor 102 is output as a signalcomponent (D-phase) to the vertical signal line.

As such reading is performed, exposure is first conducted, as shown inthe right diagram in FIG. 9. After the exposure, the floating diffusion103 is reset, and the level thereof is subjected to AD conversion(P-phase period). During the P-phase period, a value that is output fromthe a latch circuit. 261 (FIG. 5 or 8) is read from one row in the ADC31 at a time, and is stored into a frame memory 301.

After the P-phase period, the photoelectrons of the photodiode 101 aretransferred to the floating diffusion 103, and the level thereof issubjected to AD conversion (D-phase period). During the D-phase period,the value that is output from the latch circuit 261 (FIG. 5 or 8) isread from one row in the ADC 31 at a time, and is supplied to asubtracter 302.

The subtracter 302 subtracts the value read during the D-phase periodfrom the value that has been read during the P-phase period and isstored in the frame memory 301. In this manner, a signal is obtained.This exposure, the P-phase, and the D-phase are conducted simultaneouslyat all the pixels.

In a case where one ADC 31 is assigned to more than one pixel 21,“P-phase, reading, D-phase, and reading” are performed in this order onone pixel at a time.

The diagram shown on the left side in FIG. 10 shows a case where ADconversion involves 10 bits, and 20 latch columns 161 are provided. Thediagram shown on the right side is a diagram showing the order ofreading in such a case. As the 20 latch columns 161 are provided, a10-bit value of the P-phase period and a 10-bit value of the D-phaseperiod can be saved.

In a case where the ADCs 31 have both latches for the P-phase andlatches for the D-phase as described above, the frame memory 301 can beeliminated, and the process of transferring values from the ADCs 31 tothe frame memory 301 can be skipped.

In the structure shown in FIG. 10, the floating diffusion 103 is resetafter exposure, and the level thereof is subjected to AD conversion(P-phase period), and the value is saved in the latch for the P-phase.When the next timing comes, the photoelectrons of the photodiode 101 aretransferred to the floating diffusion 103, and the level thereof issubjected to AD conversion (D-phase period) and is saved in the latchfor the D-phase.

The values saved in the latch for the P-phase and the latch for theD-phase are read from one row of the ADC 31 at a time. Subtraction isperformed at a subtracter 311, and a signal is output.

In this manner, reading from the ADCs 31 is perform. The imaging device,the frame memory 301, and the subtracter 302 (or 311) may be integrated,or may be formed as different chips from one another.

In the above described embodiment, the pixels 21 and the ADCs 31 havebeen mainly described. However, circuits other than the ADCs 31 may beincluded, and a digital process for latched data may be performed, forexample.

In the above described embodiment, all the NMOSs may be replaced withPMOSs. In such a case, operation can be performed with an invertedvoltage.

<Structure with a Reduced Number of Latches>

In the above described embodiments, the comparator 201 and the latchcircuit 52 included in an ADC 31 are placed on the upper substrate 10and the lower substrate 11, respectively, and the comparator 201 isformed with the comparing transistor 221, for example.

Next, a case where the size of the latch circuit 52 is reduced byreducing the number of the latch columns 161 in the latch circuit 52 isdescribed.

FIG. 11 is a diagram showing the circuit configuration of an imagingdevice. A comparison between the circuit configuration of the imagingdevice shown in FIG. 3 and the circuit configuration shown in FIG. 11shows that the structure of a latch circuit 402 differs from thestructure of the latch circuit 52. The latch circuit 52 shown an FIG. 3includes the ten latch columns 161 of the latch columns 161-1 through161-10. On the other hand, the latch circuit 402 shown in FIG. 11includes the five latch columns 161 of latch columns 161-1 through161-5.

In this example case, the number of latch columns 161 is halved from tento five. In a case where the number of latch columns 161 is reduced asdescribed above, the process described below is performed so that a10-hit value can be obtained just as in a case where ten latch columns161 are included.

The number of latch columns 161 in the circuit configuration shown inFIG. 11 is smaller than that in the circuit configuration shown in FIG.3. However, it is possible to employ a circuit configuration with asmaller number of latch columns 161 than that in the circuitconfiguration shown in FIG. 5 or 8. FIG. 12 is a diagram showing acircuit configuration including a smaller number of latch columns 161than that in the circuit configuration shown in FIG. 5.

A comparison between the circuit configuration of the imaging deviceshown in FIG. 5 and the circuit configuration shown in FIG. 12 showsthat the structure of the latch circuit 402 differs from the structureof the latch circuit 202. The latch circuit 202 shown in FIG. 5 includesthe ten latch columns 161 of the latch columns 161-1 through 161-10. Onthe other hand, the latch circuit 402 shown in FIG. 12 includes the fivelatch columns 161 of latch columns 161-1 through 161-5.

Although not shown in a drawing, in the circuit configuration of theimaging device shown in FIG. 8, the process described below may beperformed so that the number of latch columns 161 included in the latchcircuit 202 can be reduced.

The structures other than the latch circuit 402 can be the same as thestructures in the circuit configuration shown in FIG. 3, 5, or 8, andexplanation of the components having the same structures as those in thecircuit configuration shown in FIG. 3, 5, or 8 will not be repeatedbelow. In the description below, explanation with reference to thecircuit configuration shown in FIG. 11 is continued.

In the case of the circuit configuration shown in FIG. 11, the outputfrom the comparator 51 is input to the gates of transistors 171 thatswitch on and off the latch circuit 402. As the latch circuit 402includes the five latch columns 161-1 through 161-5, there are fivebits, and code values D0 through D4 with high or low voltages are inputthereto.

When the output of the comparator 51 is high, the latch circuit 402 isswitched on, and the code values D0 through D4 are input to the latchcapacitances. When the output of the comparator 51 is low, the latchcircuit 402 is switched off, and the code values D0 through D4 are notinput to the latch capacitances. The high/low voltages of the latchcapacitances are output as Out D0 through D4 (hereinafter referred to asthe outputs D0 through D4) from a lower output stage 401 to the senseamplifier 33 of the next stage (FIG. 1).

In such a structure, the basic operation is the same as the operationdescribed above. Specifically, a ramp signal shown in A in FIG. 13 isinput to the comparator 51. The ramp signal (the solid line denoted by“Ramp”) is a signal that has a voltage gradually dropping with time.

In a case where the ramp voltage of the ramp signal that is input to thecomparator 51 is higher than the voltage of the signal (the dashed linedenoted by “SIGNAL LEVEL” in A in FIG. 13) that is input from the sideof the pixels 21 via a signal line, the output from the comparator 51 ishigh, and the latch circuit 402 is switched one. When the latch circuit402 is in the on-state, the code values D0 through D4 that areincremented with time are supplied to the latch capacitances of therespective latch columns 161-1 through 161-4.

When the ramp voltage drops gradually and becomes lower than the voltageof the signal line, the output of the comparator 51 is inverted, and thelatch circuit 402 is switched off. The code values at the time when thelatch circuit 402 is switched off are saved in the latch capacitances.In this manner, the output of the pixels 21 is digitized.

The process at the latch circuit 402 is performed in the above manner.Referring back to FIG. 3, explanation is continued. In a case where theten latches of the latch columns 161-1 through 161-10 are provided as inthe latch circuit 52 shown in FIG. 3, 10-bit values “0000000000” through“1111111111” are output as shown in B in FIG. 13.

That is, where ten latch columns 161 are provided, and the ramp voltageis compared with a signal from pixels as shown in A in FIG. 13, the codevalues D0 through D9 that are incremented from “0000000000” to“1111111111” are input to the latches representing 10 bits. When therelationship between the ramp voltage and the signal voltage isreversed, the latches are cut off from the code values, and the valuesat that moment are saved. Accordingly, the saved values are simply readout when the signal level is detected.

Meanwhile, the latch circuit 402 differs from the latch circuit 52 inthat the number of latch columns 161 is halved and is reduced to five.Therefore, if the ramp signal shown in A in FIG. 13 is used, and thesame process as above is performed in this case, a 5-bit value isobtained, but a 10-bit value is not obtained. In view of this, a rampsignal shown in A in FIG. 14 is used.

The ramp signal shown in A in FIG. 14 is a signal that has two ramps soas to obtain a 10-bit value. Hereinafter, the ramp signal from time T0to time T1 will be referred to as the first ramp, and the ramp signalfrom time T2 to time T3 will be referred to as the second ramp.

The first ramp to be output between time T1 and time T2 is a ramp forobtaining a lower 5-bit output value formed with lower five bits servingas code values. For the lower five bits, code values are repeated 32times from “00000” to “11111” as shown in B in FIG. 14. In the meantime,the relationship between the ramp voltage and the signal voltage isreversed, and the code values at that moment are saved in the latches.After that, between time T1 and time T2, the lower five bits are readout.

The period from time T1 till time T2 is the period for switching fromthe first ramp to the second ramp, and, during this period, the valuesof the lower five bits are read out from the latch circuit 402.

After that, the second ramp appears between time T2 and time T3. In thesecond ramp, the higher five bits as the code values are incrementedfrom “00000” to “11111” at intervals that are 32 times longer. In themeantime, the relationship between the ramp voltage and the signalvoltage is reversed, and the code values at that moment are saved in thelatches. After that, the higher five bits are read out.

As described above, two ramps appears, and the 5-bit values obtainedfrom the respective ramps are regarded as the lower five bits and thehigher five bits. In this manner, a 10-bit value is obtained. Also, theintervals in the first ramp differ from the intervals in the secondramp, and the intervals in the ramp for obtaining the higher bits arelonger than the intervals in the ramp for obtaining the lower bits. Inthe example case described above, the intervals in the ramp forobtaining the higher bits are 32 times longer.

FIG. 15 shows an example. In the example shown in FIG. 15, a lower 5-bitvalue “010110” is obtained in the first ramp, and a higher 5-bit value“10001” is obtained in the second ramp. As the lower five bits and thehigher five bits are combined, a 10-bit digital value “1000101110” iscompleted.

As described above, a ramp signal having two ramps is used, and lowerfive bits and higher five bits are obtained. In this manner, a 10-bitoutput value can be obtained from the latch circuit 402 having fivelatch columns 161.

In the above described example, during the second ramp, the code valuesof the higher five bits are input at 32-times longer intervals. However,the code value intervals may not be varied where the gradient of theramp signal is made 32 times higher. The former is preferable whenpriority is put on accuracy, and the latter is preferable when priorityis put on speed.

In the above described example, the lower bits are determined in thefirst ramp, and the higher bits are determined in the second ramp.However, the higher hits may be determined in the first ramp, and thelower bits may be determined in the second ramp.

Still, it is considered preferable to determine the lower bits in thefirst ramp and determine the higher bits in the second ramp as describedabove. The reason is that the signal from the pixels 21 might varyslightly due to the influence of dark current or the like, andtherefore, the lower bits are preferably determined in an early stage.

While two ramps are used to obtain a 10-bit value, there is a time lagbetween the first ramp and the second ramp. The signal from the pixels21 might fluctuate during the period between the first ramp and thesecond ramp. Referring now to FIG. 16, this aspect is described.

During the first ramp, the signal from the pixels 21 is “0000100000”,for example. As the lower five bits are obtained from the first ramp,“00000” is obtained in this case. During the second ramp, the signalfrom the pixels 21 should also be “0000100000”, and the higher five bits“00001” are obtained.

However, if the signal from the pixels 21 fluctuates slightly andchanges to “0000011111” due to some influence during the second ramp,the higher five bits “00000” are obtained. Therefore, the valueeventually obtained in this case is “0000000000” as shown in FIG. 16.Where the value “0000100000” should be obtained, a different value“0000000000” might be obtained.

In this case, during the period between the first ramp and the secondramp, the signal from the pixels 21 changes by 1 from “32” to “31” indecimal notation, and changes only from “0000000000” to “0000011111” inbinary. However, in a case where two ramps are used, and five bits areobtained each time, there is a possibility that the value “0000000000”,instead of “0000100000”, obtained as described above. In this case, “0”is obtained where the value “32” in decimal notation should be obtained.

In a case where a pixel signal fluctuates to affect the sixth bit asabove, a completely different value might be obtained as a result of ADconversion, though the signal has changed only slightly. So as toprevent such a great change, the measures described below may be taken.

As a first measure, a gray code may be used as code values. A gray codeis a code that is advantageously used because only one bit changes whena change from a value to an adjacent value occurs.

In a gray code, the digit immediately next to the lower five bits“00000” does not change, and accordingly, there is a lower possibilitythat a large change as described above occurs. Where a carry is producedat the sixth digit, the value changes as follows: . . . , 10001, 10000,110000, 110001, . . . . Since the highest or the lowest digit of thelower five digits is subject to a carry, there is no possibility that acompletely different value is obtained as in the case with a binarycode, even if the sixth digit changes.

For example, in a case where the first ramp shows “0000110000”, and“10000” is obtained as the lower five bits, the signal value mightdecrease by 1 to “0000010000” during the second ramp, and the higherfive bits become “00000”. In that case, the combined value is“0000010000”, and the result of AD conversion is a value that is smallerby 1.

Also, in a case where the first ramp shows “0000110001” and “10001” isobtained as the lower five bits, for example, the signal value mightbecome lower by 2 during the second ramp, and “00000” is obtained as thehigher five bits, in that case, the combined value is “0000010001”, andthe result of AD conversion is a value that is smaller by 3.

The same applies in cases where the pixel values becomes larger and acarry occurs. With a gray code, a result of AD conversion does notbecome a greatly different value when a change in the pixel signal issmall as in the case with a binary code.

A gray code may be applied to all the bits. However, with the variablevalues and noise and the like in the pixel signal being taken intoaccount, a gray code and a binary code may be used together. Forexample, a gray code is applied to the lower bits in the variable range,and a binary code is applied to the higher bits.

Even in a gray code, if the pixel signal fluctuates beyond a carry orborrow at the sixth digit, the result of AD conversion does not matchthe true value. As a second measure, one digit may be shared between thevalue obtained during the first ramp and the value obtained during thesecond ramp, by a binary code.

During the first ramp, the lower five digits are converted as in theabove described case. During the second ramp, the fifth to ninth digitsare input as the code values. As a result, 9-bit AD conversion, insteadof 10-bit AD conversion, is performed. If the fifth digit in the secondramp differs from the value in the first ramp, the value in the firstramp is employed and is combined with the sixth digit. In this manner,correction is performed.

For example, in a case where the signal is “0000100000” during the firstramp, and the lower five digits are “00000”, the signal might change to“0000011111” during the second ramp, and, as a result, “00001” isobtained as the upper digits, as shown in FIG. 17. In this case, asshown in the portion surrounded by an ellipse in the left side in FIG.17, “0” at the first digit obtained during the first ramp and “1” at thefifth digit obtained during the second ramp should be the same value,but differ from each other.

In this case, it is determined that the difference is caused by a borrowbased on the value obtained during the first ramp. The higher fivedigits are corrected to be “00010”, so that “000010000” is obtained asthe final result.

In a case where the value obtained during the first ramp is “11111” orthe like, and the value obtained during the second ramp is “****0”, itcan be determined that there has been a carry. That is, there has been aborrow if the fourth digit in the first ramp is “0”, and there has beena carry if the fourth digit in the first ramp is “1”. As describedabove, a digital signal can be corrected based on the value of the bitimmediately below the shared bit.

As long as a binary code is applied to the shared digit and the digitimmediately below the shared digit, a gray code may be applied to theother digits.

As described above, even if the number of bits in the latch circuit 402is reduced, two ramps are formed so that a 10-bit (or 9-bit) value canbe generated. In such a case, the pixels 21 also output a reset leveland a signal level. The reset level is the reference voltage of thepixels at that moment. The difference between the signal level and thereset level serves as the true signal value. The corresponding operationis shown in FIG. 18.

As described above, the reset level and the signal level each have tworamps and are subjected to AD conversion. As shown in FIG. 18, the firstramp for the reset level starts at time T11, and the second ramp for thereset level starts at time T12.

The first ramp for the signal level starts at time T13, and the secondramp for the signal level starts at time T14. In this manner, digitalvalues are output in the following order: the lower five hits of thereset level, the higher five bits of the reset level, the lower fivebits of the signal level, and the higher five bits of the signal level.

These digital signals are stored into the frame memory 301 of the nextstage as in the case described above with reference to FIG. 9. At thetime when the higher five bits of the signal level are output at last,the reset level is subtracted from the signal level in the subtracter302. The imaging device, the frame memory 301, and the subtracter 302may be formed as different semiconductor elements from one another, ormay be integrated.

FIG. 19 is a diagram for explaining the operation of the ADCs 31 when a10-bit output value is generated from two ramps. After exposure, thefloating diffusions 103 of the pixels 21 are reset, and the levelthereof is subjected to AD conversion (P-phase period). A P-phase 1 isthe period during which lower five bits are converted and are output tothe sense amplifier 33. A P-phase 2 is the period during which higherfive bits are converted and are output to the sense amplifier 33.

After the output during the P-phase 2 is finished, the photoelectrons ofthe photodiodes 101 are transferred to the floating diffusions 103. Inthe same manner as above, conversion and output are repeated twice. Theconversion in each of the P-phase 1, the P-phase 2, a D-phase 1, and aD-phase 2 is performed as all the ADCs 31 operate in parallel. Theoutput to the sense amplifier 33 is performed while the ADCs 31 arescanned one by one. In a case where one ADC 31 is assigned to one morethan pixel 21, this operation is repeated while the pixels are selectedone by one.

As the reset level is distributed in a narrow range, the correspondingramp signal may be short as shown in FIG. 18. That is, as shown in FIG.18, the fluctuation range of the voltage of the ramp signal at the timeof detection of the reset level may be narrower than the fluctuationrange of the voltage of the ramp signal at the time of detection of thesignal level. Also, the intervals of the ramp signal at the time ofdetection of the reset level may be shorter than the intervals of theramp signal at the time of detection of the signal level.

Among the four ramps including the signal level, the ramps are madestraight only in this range. At the portions corresponding to largesignal values, the gradients of the ramps are made higher, or the speedof incrementation of the code values is lowered, so that the ADconversion on the high-luminance side can be performed at shorterintervals, and the data amount can be reduced.

That is, the voltage of the ramp signal at the time when a signal of thehigh-luminance side of the signal level is obtained may vary morerapidly than the voltage of the ramp signal at the time when a signal ofthe low-luminance side is obtained. Alternatively, the speed of thesupply of the code values D to the latch circuit 402 at the time when asignal of the high-luminance side of the signal level is obtained may belower than the speed of the supply of the code values D to the latchcircuit 402 at the time when a signal of the low-luminance side isobtained. With this, the data amount can be reduced.

In such a case, the subtracter 302 calculates a difference from a bentpoint by referring to the reset level value. The value on thehigh-luminance side is corrected based on the difference, so that acorrect value can be obtained after subtraction. A bent point means apoint when the variation of the voltage of the ramp signal becomeslarger, or a point when the speed of the code value supply changes.Since the reset level is distributed in a narrow range, the reset levelcan be expressed by one ramp if the range falls within 1/32 of aD-phase.

In the above described embodiment, one ramp is formed when the latchcircuit 52 including the ten latch columns 161-1 through 161-10 is used,and two ramps are formed when the latch circuit 402 including the fivelatch columns 161-1 through 161-5 is used.

The number of latch columns and the number of ramps to be formed are notlimited to the above combinations, which are merely examples. Forexample, three latch columns may be provided, and three ramps may beformed so that a 9-bit output value can be obtained.

In a case where three ramps are formed, for example, higher bits, lowerbits, and intermediate bits between the higher bits and the lower bitsare obtained, and a digital value may be generated from a combination ofthe higher bits, the intermediate bits, and the lower bits.

With this being taken into account, the same number of ramps as thenumber of bits may be formed, for example. In a case where the samenumber of ramps as the number of bits are formed according to thepresent technology, the operation of a sloped ADC is achieved. Even ifthe number of ramps is increased to the number of bits, each ramp sweepslike a sloped ADC. The ramp waveform may be the same each time, andaccordingly, high reproducibility is achieved. Thus, high AD conversionaccuracy can be maintained.

In view of this, high-accuracy AD conversion can be performed accordingto the present technology, even if the same number of ramps as thenumber of bits are formed.

According to the present technology, the size of a solid-state imagingelement can be reduced. Also, one ADC can be shared by a small number ofpixels, a higher processing speed can be achieved. Also, even if theobject to be imaged is a moving object, an image with little distortioncan be obtained.

Also, a structure that consumes less power can be formed. Further,small-sized analog circuits and small-sized digital circuits areprevented from coexisting, and the voltages and the manufacturingprocesses for the upper substrate and the lower substrate can beoptimized.

<Electronic Apparatus>

The present disclosure is not limited to applications to imagingdevices, but can be applied to any electronic apparatus using an imagingdevice at the image capturing unit (photoelectric conversion unit), suchas an imaging apparatus such as a digital still camera or a videocamera, a portable terminal having an imaging function such as aportable telephone, and a copying machine using an imaging device at theimage reading unit. The form of the above described module mounted on anelectronic apparatus, or a camera module, is an imaging device in somecases.

FIG. 20 is a block diagram showing an example structure of an imagingapparatus as an example of an electronic apparatus of the presentdisclosure. As shown in FIG. 20, an imaging apparatus 500 of the presentdisclosure includes an optical system including lenses 501, an imagingelement 502, a DSP circuit 503 as a camera signal processing unit, aframe memory 504, a display device 505, a recording device 506, anoperating system 507, and a power supply system 508.

The DSP circuit 503, the frame memory 504, the display device 505, therecording device 506, the operating system 507, and the power supplysystem 508 are connected to one another via a bus line 509. A CPU 510controls the respective components in the imaging apparatus 500.

The lenses 501 gather incident light (image light) from an object, andform an image on the imaging surface of the imaging element 502. Theimaging element 502 converts in pixel unit the light intensity of theincident light gathered onto the imaging surface by the lenses 501 intoan electrical signal, and outputs the electrical signal as a pixelsignal. A solid-state imaging element according to the above describedembodiment can be used as the imaging element 502.

The display device 505 is formed with a panel-type display device suchas a liquid crystal display device or an organic Electro Luminescence(EL) display device, and displays a moving image or a still imagecaptured by the imaging element 502. The recording device 506 recordsthe moving image or the still image captured by the imaging element 502on a recording medium such as a video tape or a Digital Versatile Disk(DVD).

The operating system 507 is operated by a user, and issues operatinginstructions related to various functions of this imaging apparatus. Thepower supply system 508 supplies various kinds of power supplies as theoperating power supplies for the DSP circuit 503, the frame memory 504,the display device 505, the recording device 506, and the operatingsystem 507, as appropriate.

Such an imaging apparatus 500 is used in a video camera, a digital stillcamera, or a camera module for mobile devices such as portabletelephones. In this imaging apparatus 500, an imaging device accordingto the above described embodiment can be used as the imaging element502.

<Recording Medium>

The above described series of processes can be performed by hardware,and can also be performed by software. When the series of processes areto be performed by software, the program that forms the software isinstalled into a computer. Here, the computer may be a computerincorporated into special-purpose hardware, or may be a general-purposepersonal computer that can execute various kinds of functions as variouskinds of programs are installed thereinto.

For example, in the imaging apparatus 500 shown in FIG. 20, the CPU 510loads and executes a program recorded in the recording device 506, toperform the above described series of processes.

The program to be executed by the computer (the CPU 510) may be recordedon a removable medium (not shown) as a packaged medium to be provided,for example. Alternatively, the program can be provided via a wired orwireless transmission medium such as a local area network, the Internet,or digital satellite broadcasting.

In the imaging apparatus 500 (the computer), the program can beinstalled into the recording device 506 via the bus line 509 when theremovable medium is mounted on a drive (not shown). The program can alsobe received by a communication unit via a wired or wireless transmissionmedium, and be installed into the recording device 506. Alternatively,the program can be installed beforehand into the recording device 506.

The program to be executed by the computer may be a program forperforming processes in chronological order in accordance with thesequence described in this specification, or may be a program forperforming processes in parallel or performing a process when necessary,such as when there is a call.

In this specification, a system means an entire apparatus formed withmore than one device.

It should be noted that embodiments of the present technology are notlimited to the above described embodiments, and various modificationsmay be made to them without departing from the scope of the presenttechnology.

The advantageous effects described in this specification are merelyexamples, and the advantageous effects of the present technology are notlimited to them and may include other effects.

The present technology can also be in the following forms.

(1)

An imaging device including

-   -   an upper substrate and a lower substrate that are stacked,    -   wherein    -   a pixel and a comparing unit that compares the voltage of a        signal from the pixel with the ramp voltage of a ramp signal are        provided on the upper substrate, the ramp voltage varying with        time, and    -   a storage unit that stores a code value obtained, at a time when        a comparison result from the comparing unit is inverted is        provided on the lower substrate.        (2)

The imaging device of (1), wherein the comparing unit is formed with atransistor that receives the voltage of the signal from the pixel at thegate, receives the ramp voltage at the source, and outputs a drainvoltage.

(3)

The imaging device of (2), wherein a voltage for resetting thetransistor is higher than the power-supply voltage of a circuit of alater stage.

(4)

The imaging device of (3), wherein the power-supply voltage of thestorage unit is lower than the power-supply voltage of the circuit ofthe later stage.

(5)

The imaging device of any of (1) through (4), wherein the power-supplyvoltage of the upper substrate is higher than the power-supply voltageof the lower substrate.

(6)

The imaging device of one of (1) through (5), wherein an analog circuitis provided on the upper substrate, and a digital circuit is provided onthe lower substrate.

(7)

The imaging device of any of (1) through (6), wherein

-   -   the comparing unit and the storage unit are formed with Negative        channel Metal Oxide Semiconductors (NMOSs), and    -   the comparing unit and the storage unit have the same high power        supply, and have different low power supplies.        (8)

The imaging device of any of (1) through (6), wherein

-   -   the comparing unit and the storage unit are formed with Positive        channel Metal Oxide Semiconductors (PMOSs), and    -   the comparing unit and the storage unit have the same low power        supply, and have different high power supplies.        (9)

The imaging device of any of (1) through (8), wherein, of thetransistors included in the storage unit, a transistor that receives asignal from the comparing unit is made to have a high withstand voltage.

(10)

An electronic apparatus including:

-   -   an imaging device including    -   an upper substrate and a lower substrate that are stacked,    -   wherein a pixel and a comparing unit that compares the voltage        of a signal from the pixel with the ramp voltage of a ramp        signal are provided on the upper substrate, the ramp voltage        varying with time, and    -   a storage unit that stores a code value obtained at a time when        a comparison result from the comparing unit is inverted is        provided on the lower substrate; and    -   a signal processing unit that performs signal processing on a        signal that is output from the imaging device.

REFERENCE SIGNS LIST

-   10 Upper substrate-   11 Lower substrate-   21 Pixel-   31 ADC-   51 Comparator-   52 Latch circuit-   161 Latch column-   221 Comparing transistor-   261 Latch circuit-   402 Latch circuit

What is claimed is:
 1. An imaging device comprising: an upper substrateand a lower substrate, the upper substrate and the lower substrate beingstacked, wherein a pixel and a comparing unit configured to compare avoltage of a signal from the pixel with a ramp voltage of a ramp signalare provided on the upper substrate, the ramp voltage varying with time,and a storage unit storing a code value obtained at a time when acomparison result from the comparing unit is inverted is provided on thelower substrate.
 2. The imaging device according to claim 1, wherein thecomparing unit is formed with a transistor configured to receive thevoltage of the signal from the pixel at a gate, receive the ramp voltageat a source, and output a drain voltage.
 3. The imaging device accordingto claim 2, wherein a voltage for resetting the transistor is higherthan a power-supply voltage of a circuit of a later stage.
 4. Theimaging device according to claim 3, wherein a power-supply voltage ofthe storage unit is lower than the power-supply voltage of the circuitof the later stage.
 5. The imaging device according to claim 1, whereina power-supply voltage of the upper substrate is higher than apower-supply voltage of the lower substrate.
 6. The imaging deviceaccording to claim 1, wherein an analog circuit is provided on the uppersubstrate, and a digital circuit is provided on the lower substrate. 7.The imaging device according to claim 1, wherein the comparing unit andthe storage unit are formed with Negative channel Metal OxideSemiconductors (NMOSs), and the comparing unit and the storage unit havethe same high power supply, and have different low power supplies. 8.The imaging device according to claim 1, wherein the comparing unit andthe storage unit are formed with Positive channel Metal OxideSemiconductors (PMOSs), and the comparing unit and the storage unit havethe same low power supply, and have different high power supplies. 9.The imaging device according to claim 1, wherein, of transistorsincluded in the storage unit, a transistor configured to receive asignal from the comparing unit is made to have a high withstand voltage.10. An electronic apparatus comprising: an imaging device including: anupper substrate and a lower substrate, the upper substrate and the lowersubstrate being stacked, wherein a pixel and a comparing unit configuredto compare a voltage of a signal from the pixel with a ramp voltage of aramp signal are provided on the upper substrate, the ramp voltagevarying with time, and a storage unit storing a code value obtained at atime when a comparison result from the comparing unit is inverted isprovided on the lower substrate; and a signal processing unit configuredto perform signal processing on a signal output from the imaging device.